Kimimori Hamada

According to our database, Kimimori Hamada authored at least 4 papers between 2004 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Analysis of neutron-induced single-event burnout in SiC power MOSFETs.

Tomoyuki Shoji, Shuichi Nishida, Kimimori Hamada, Hiroshi Tadano

Microelectron. Reliab., 2015

2008

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography.

Giovanni Breglio, Andrea Irace, Ettore Napoli, Michele Riccio, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta

Microelectron. Reliab., 2008

2007

Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell.

Giovanni Breglio, Andrea Irace, Ettore Napoli, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta

Microelectron. Reliab., 2007

2004

Investigation of IGBT turn-on failure under high applied voltage operation.

Masayasu Ishiko, Koji Hotta, Sachiko Kawaji, Takahide Sugiyama, Tomoyuki Shouji, Takeshi Fukami, Kimimori Hamada

Microelectron. Reliab., 2004