Kimihiko Kato

Orcid: 0000-0002-7117-0838

According to our database1, Kimihiko Kato authored at least 10 papers between 2018 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs.
IEEE Access, 2024

Occurrence and Mitigation of Hot Carrier Degradation in Cryogenic MOSFET Operation.
Proceedings of the Device Research Conference, 2024

2023
Single-Electron Transistor Operation of a Physically Defined Silicon Quantum Dot Device Fabricated by Electron Beam Lithography Employing a Negative-Tone Resist.
IEICE Trans. Electron., October, 2023

Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality.
IEEE Access, 2023

Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2022
Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

2021
Buried nanomagnet realizing high-speed/low-variability silicon spin qubits: implementable in error-correctable large-scale quantum computers.
Proceedings of the 2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021

2019
Advanced MOS Device Technology for Low Power Logic LSI.
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

Fabrication of High Quality InAs-on-Lnsulator Structures by Smart Cut Process with Reuse of InAs Wafers.
Proceedings of the 2019 International 3D Systems Integration Conference (3DIC), 2019

2018
MOS Device Technology using Alternative Channel Materials for Low Power Logic LSI.
Proceedings of the 48th European Solid-State Device Research Conference, 2018


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