Kim T. Le

According to our database, Kim T. Le authored at least 9 papers between 1984 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Privacy Assurance in Data-Aggregation for Multiple MAX Transactions.

Kim T. Le, Parmesh Ramanathan, Kewal K. Saluja

Proceedings of the 39th Annual Computer Software and Applications Conference, 2015

2013

Privacy Assurances in Multiple Data-Aggregation Transactions.

Kim T. Le, Parmesh Ramanathan, Kewal K. Saluja

Proceedings of the Information Security and Cryptology - ICISC 2013, 2013

2007

Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access Scan.

Kim T. Le, Dong Hyun Baik, Kewal K. Saluja

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

2005

A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits.

Hiroshi Takahashi, Keith J. Keller, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

2002

A Concurrent Fault Simulation for Crosstalk Faults in Sequential Circuits.

Marong Phadoongsidhi, Kim T. Le, Kewal K. Saluja

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

Reduction of Target Fault List for Crosstalk-Induced Delay Faults by using Layout Constraints.

Keith J. Keller, Hiroshi Takahashi, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

1998

A Heuristic Measure to Maximize Detected Faults per Test.

Kim T. Le, Kewal K. Saluja

J. Electron. Test., 1998

1986

A Novel Approach for Testing Memories Using a Built-In Self Testing Technique.

Kim T. Le, Kewal K. Saluja

Proceedings of the Proceedings International Test Conference 1986, 1986

1984

Testable design of large random access memories.

Kewal K. Saluja, Kim Thang Le

Integr., 1984