Key-one Ahn

According to our database, Key-one Ahn authored at least 1 paper in 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Degradation of adhesion between Cu and epoxy-based dielectric during exposure to hot humid environments.

Key-one Ahn, Se-Hoon Park, Young-Ho Kim

Microelectron. Reliab., 2017