Keno Sato

According to our database¹, Keno Sato authored at least 18 papers between 2019 and 2024.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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On csauthors.net:

Bibliography

2024

Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society.

[BibT_eX]

[DOI]

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

2023

Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2023

Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2023

A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference in Asia, 2023

2022

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.

[BibT_eX]

[DOI]

J. Electron. Test., 2022

Innovative Practices Track: Innovative Analog Circuit Testing Technologies.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST.

[BibT_eX]

[DOI]

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2021

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2021

Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method.

[BibT_eX]

[DOI]

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International Conference on Electronics, 2021

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.

[BibT_eX]

[DOI]

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020

Accurate Testing of Precision Voltage Reference by DC-AC Conversion.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE Asian Test Symposium, 2020

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

Innovative Test Practices in Japan.

[BibT_eX]

[DOI]

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference in Asia, 2019

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE International Conference on ASIC, 2019

Evaluation of Null Method for Operational Amplifier Short-Time Testing.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE International Conference on ASIC, 2019

Keno Sato

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