Kenneth S. M. Fung

According to our database, Kenneth S. M. Fung authored at least 12 papers between 2006 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

An INSPECT Measurement System for Moving Objects.

Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam

IEEE Trans. Instrum. Meas., 2015

An edge-from-focus approach to 3D inspection and metrology.

Fuqin Deng, Jia Chen, Jianyang Liu, Zhijun Zhang, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam

Proceedings of the Image Processing: Machine Vision Applications VIII, 2015

2013

A polynomial phase-shift algorithm for high precision three-dimensional profilometry.

Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam

Proceedings of the Image Processing: Machine Vision Applications VI, 2013

An elliptic phase-shift algorithm for high speed three-dimensional profilometry.

Fuqin Deng, Zhao Li, Jia Chen, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam

Proceedings of the Image Processing: Machine Vision Applications VI, 2013

2012

An illumination-invariant phase-shifting algorithm for three-dimensional profilometry.

Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, W. H. Leung, Edmund Y. Lam

Proceedings of the Image Processing: Machine Vision Applications V, 2012

2010

EC-EGI: enriched complex EGI for 3D shape registration.

Zhaozheng Hu, Ronald Chung, Kenneth S. M. Fung

Mach. Vis. Appl., 2010

2009

Reference-Free Machine Vision Inspection of semiconductor die Images.

Ada N. Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S. M. Fung, W. H. Leung

Int. J. Image Graph., 2009

2008

Handling of multi-reflections in wafer bump 3D reconstruction.

Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung

Proceedings of the IEEE International Conference on Systems, 2008

2007

Optimization of Bit-Pairing Codification with Learning for 3D Reconstruction.

Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung, Yangsheng Xu

Int. J. Image Graph., 2007

Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights.

Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung

Proceedings of the 2007 International Conference on Image Processing, 2007

2006

Bit-pairing Codification for Binary Pattern Projection System.

Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung

Proceedings of the 18th International Conference on Pattern Recognition (ICPR 2006), 2006

A novel design of grating projecting system for 3D reconstruction of wafer bumps.

Shu Yuan, Ronald Chung, Tan Zheng, Jun Cheng, Edmund Y. Lam, Kenneth S. M. Fung, Fan Wang

Proceedings of the Conference on Three-Dimensional Image Capture and Applications VII, 2006