Kenneth P. Parker

According to our database, Kenneth P. Parker authored at least 40 papers between 1975 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2012

Capacitive sensing testability in complex memory devices.

Kenneth P. Parker

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Surviving state disruptions caused by test: A case study.

Kenneth P. Parker, Shuichi Kameyama, David Dubberke

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Surviving state disruptions caused by test: The "Lobotomy Problem".

Kenneth P. Parker

Proceedings of the 2011 IEEE International Test Conference, 2010

Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing.

Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird

Proceedings of the 2011 IEEE International Test Conference, 2010

Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins.

C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Testing bridges to nowhere - combining Boundary Scan and capacitive sensing.

Steve Sunter, Kenneth P. Parker

Proceedings of the 2009 IEEE International Test Conference, 2009

What is IEEE P1149.8.1 and why?

Kenneth P. Parker, Jeff Burgess

Proceedings of the 2009 IEEE International Test Conference, 2009

An outlier detection based approach for PCB testing.

Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Boundary-Scan Testing of Power/Ground Pins.

Kenneth P. Parker, Neil G. Jacobson

Proceedings of the 2008 IEEE International Test Conference, 2008

Augmenting Boundary-Scan Tests for Enhanced Defect Coverage.

Dayton Norrgard, Kenneth P. Parker

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Finding power/ground defects on connectors - a new approach.

Kenneth P. Parker, Stephen Hird

Proceedings of the 2007 IEEE International Test Conference, 2007

A bead probe CAD strategy for in-circuit test.

Kenneth P. Parker, Don DeMille

Proceedings of the 2007 IEEE International Test Conference, 2007

2005

Bead probes in practice.

Kenneth P. Parker

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

The effects of defects on high-speed boards.

Kenneth P. Parker

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Board Test Coverage Needs to be Standardized.

Kenneth P. Parker

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

A New Probing Technique for High-Speed/High-Density Printed Circuit Boards.

Kenneth P. Parker

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Testing for what?

Kenneth P. Parker

IEEE Des. Test Comput., 2003

IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.

Bill Eklow, Carl Barnhart, Kenneth P. Parker

IEEE Des. Test Comput., 2003

Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?

Kenneth P. Parker

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Board Test Is NOT Mature.

Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Test Coverage: What Does It Mean When a Board Test Passes?.

Kathy Hird, Kenneth P. Parker, Bill Follis

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.

Bill Eklow, Carl Barnhart, Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Frequency detection-based boundary-scan testing of AC coupled nets.

Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

System issues in boundary-scan board test.

Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1997

Design, Fabrications and Use of Mixed-Signal IC Testability Structures.

Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Opens Board Test Coverage: When is 99% Really 40%?

Mick Tegethoff, Kenneth P. Parker, Ken Lee

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Introduction ITC 1996 Lecture Series on Unpowered Opens Testing.

Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

IEEE Std 1149.1: Where Are We? Where From Here?

Mick Tegethoff, Kenneth P. Parker

IEEE Des. Test Comput., 1995

The ITC Lecture Series: An Experiment.

Kenneth P. Parker, David Greene

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Observations on the 1149.x Family of Standards.

Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Structure and Metrology for an Analog Testability Bus.

Kenneth P. Parker, John E. McDermid, Stig Oresjo

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1991

A language for describing boundary scan devices.

Kenneth P. Parker, Stig Oresjo

J. Electron. Test., 1991

1989

The impact of boundary scan on board test.

Kenneth P. Parker

IEEE Des. Test, 1989

1986

Testability: Barriers to Acceptance.

Kenneth P. Parker

IEEE Des. Test, 1986

1982

Design for Testability - A Survey.

Thomas W. Williams, Kenneth P. Parker

IEEE Trans. Computers, 1982

1979

Testing Logic Networks and Designing for Testability.

Thomas W. Williams, Kenneth P. Parker

Computer, 1979

1978

Sequential Circuit Output Probabilities From Regular Expressions.

Kenneth P. Parker, Edward J. McCluskey

IEEE Trans. Computers, 1978

Boolean Network Probabilities and Network Design.

Edward J. McCluskey, Kenneth P. Parker, John J. Shedletsky

IEEE Trans. Computers, 1978

1975

Analysis of Logic Circuits with Faults Using Input Signal Probabilities.

Kenneth P. Parker, Edward J. McCluskey

IEEE Trans. Computers, 1975

Probabilistic Treatment of General Combinational Networks.

Kenneth P. Parker, Edward J. McCluskey

IEEE Trans. Computers, 1975