Kenneth M. Butler

According to our database, Kenneth M. Butler authored at least 57 papers between 1988 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2017

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.

Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen

Proceedings of the IEEE International Test Conference, 2017

2016

Statistical outlier screening as a test solution health monitor.

David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar

Proceedings of the 2016 IEEE International Test Conference, 2016

What we know after twelve years developing and deploying test data analytics solutions.

Kenneth M. Butler, Amit Nahar, W. Robert Daasch

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.

Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.

Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler

Proceedings of the 2014 International Test Conference, 2014

2013

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

IEEE Trans. Very Large Scale Integr. Syst., 2013

Efficient Process Shift Detection and Test Realignment.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Physics-Based Low-Cost Test Technique for High Voltage LDMOS.

Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi

J. Electron. Test., 2013

Test data analytics - Exploring spatial and test-item correlations in production test data.

Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler

Proceedings of the 2013 IEEE International Test Conference, 2013

A design-for-reliability approach based on grading library cells for aging effects.

Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy

Proceedings of the 2013 IEEE International Test Conference, 2013

Adaptive quality binning for analog circuits.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Early prediction of NBTI effects using RTL source code analysis.

Jayanand Asok Kumar, Kenneth M. Butler, Heesoo Kim, Shobha Vasudevan

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2011

Adaptive multidimensional outlier analysis for analog and mixed signal circuits.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Proceedings of the 2011 IEEE International Test Conference, 2011

Die-level adaptive test: Real-time test reordering and elimination.

Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar

Proceedings of the 2011 IEEE International Test Conference, 2011

Test cost reduction through performance prediction using virtual probe.

Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Power Supply Noise: A Survey on Effects and Research.

Mohammad Tehranipoor, Kenneth M. Butler

IEEE Des. Test Comput., 2010

Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Proceedings of the 2011 IEEE International Test Conference, 2010

Adapting to adaptive testing.

Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Multidimensional Test Escape Rate Modeling.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch

IEEE Des. Test Comput., 2009

Quality improvement and cost reduction using statistical outlier methods.

Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Modeling Test Escape Rate as a Function of Multiple Coverages.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.

Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs.

Mohammad Tehranipoor, Kenneth M. Butler

IEEE Des. Test Comput., 2007

2006

Guest Editor's Introduction: ITC Helps Get More Out of Test.

Kenneth M. Butler

IEEE Des. Test Comput., 2006

2004

Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques.

Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya.

Kenneth M. Butler

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs.

Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang

IEEE Des. Test Comput., 2003

A Case Study of IR-Drop in Structured At-Speed Testing.

Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .

Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Is ITC Bored with Board Test?

Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Facilitating Rapid First Silicon Debug.

Hari Balachandran, Kenneth M. Butler, Neil Simpson

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Defect-Oriented Testing and Defective-Part-Level Prediction.

Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang

IEEE Des. Test Comput., 2001

An analysis of power reduction techniques in scan testing.

Jayashree Saxena, Kenneth M. Butler, Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

A case study on the implementation of the Illinois Scan Architecture.

Frank F. Hsu, Kenneth M. Butler, Janak H. Patel

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.

Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

An empirical study on the effects of test type ordering on overall test efficiency.

Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Estimating the Economic Benefits of DFT.

Kenneth M. Butler

IEEE Des. Test Comput., 1999

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data.

Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Correlation of logical failures to a suspect process step.

Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Expediting ramp-to-volume production.

Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

On applying non-classical defect models to automated diagnosis.

Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

The stuck-at fault: it ain't over 'til it's over.

Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Automated Diagnosis in Testing and Failure Analysis.

Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena

IEEE Des. Test Comput., 1997

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Bridging Fault Diagnosis in the Absence of Physical Information.

David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Integrating Automated Diagnosis into the Testing and Failure Analysis Operations.

Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Test Generation and Design for Test for a Large Multiprocessing DSP.

Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

Deep Submicron: Is Test Up to the Challenge?

Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Correlating defect level to final test fault coverage for modular structured designs [microcontroller family].

Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1992

The roles of controllability and observability in design for test.

Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

1991

Exact ordered binary decision diagram size when representing classes of symmetric functions.

Don E. Ross, Kenneth M. Butler, M. Ray Mercer

J. Electron. Test., 1991

Fast functional evaluation of candidate OBDD variable orderings.

Don E. Ross, Kenneth M. Butler, Rohit Kapur, M. Ray Mercer

Proceedings of the conference on European design automation, 1991

Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams.

Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer

Proceedings of the 28th Design Automation Conference, 1991

1990

The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design.

Kenneth M. Butler, M. Ray Mercer

Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, 1990

1988

CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology.

Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler

Proceedings of the 25th ACM/IEEE Conference on Design Automation, 1988