Kenji Shimazaki

According to our database1, Kenji Shimazaki authored at least 13 papers between 2000 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Bibliography

2010
Gate Delay Estimation in STA under Dynamic Power Supply Noise.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010

2009
A minimum decap allocation technique based on simultaneous switching for nanoscale SoC.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

2006
An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs.
IEICE Trans. Electron., 2006

2005
Power-Supply Noise Reduction with Design for Manufacturability.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2005

Dynamic Power-Supply and Well Noise Measurements and Analysis for Low Power Body Biased Circuits.
IEICE Trans. Electron., 2005

An integrated timing and dynamic supply noise verification for nano-meter CMOS SoC designs.
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

Substrate-noise and random-fluctuations reduction with self-adjusted forward body bias.
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004
Full-chip vectorless dynamic power integrity analysis and verification against 100uV/100ps-resolution measurement.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2003
A Design Methodology for Low EMI Noise LSI with Fast and Accurate Estimation.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003

A substrate noise analysis methodology for large-scale mixed-signal ICs.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002
An EMI-Noise Analysis on LSI Design with Impedance Estimation.
Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

A design methodology for low EMI-noise microprocessor with accurate estimation-reduction-verification.
Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, 2002

2000
LEMINGS: LSI's EMI-Noise Analysis with Gate Level Simulator.
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000


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