Ken Nakata

According to our database, Ken Nakata authored at least 8 papers between 2008 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Validity of Spatio-Temporal Gait Parameters in Healthy Young Adults Using a Motion-Sensor-Based Gait Analysis System (ORPHE ANALYTICS) during Walking and Running.

Yuki Uno, Issei Ogasawara, Shoji Konda, Natsuki Yoshida, Naoki Otsuka, Yuya Kikukawa, Akira Tsujii, Ken Nakata

Sensors, 2023

2022

An Experimental Feasibility Study Evaluating the Adequacy of a Sportswear-Type Wearable for Recording Exercise Intensity.

Yoshihiro Marutani, Shoji Konda, Issei Ogasawara, Keita Yamasaki, Teruki Yokoyama, Etsuko Maeshima, Ken Nakata

Sensors, 2022

Close-Contact Detection Using a Single Camera for Sports Considering Occlusion.

Ryosuke Hasegawa, Akira Uchiyama, Fumio Okura, Daigo Muramatsu, Issei Ogasawara, Hiromi Takahata, Ken Nakata, Teruo Higashino

IEEE Access, 2022

Challenges and Potential of N-polar GaN HEMT for beyond 5G Wireless Network.

Shigeki Yoshida, Kozo Makiyama, Akihiro Hayasaka, Isao Makabe, Ken Nakata

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

Innovative RF Device Technologies for Advanced Information and Communications Network Society.

Kozo Makiyama, Shigeki Yoshida, Ken Nakata, Yasuyuki Miyamoto

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2021

Human Localization Using a Single Camera Towards Social Distance Monitoring During Sports.

Ryosuke Hasegawa, Akira Uchiyama, Fumio Okura, Daigo Muramatsu, Issei Ogasawara, Hiromi Takahata, Ken Nakata, Teruo Higashino

Proceedings of the Mobile and Ubiquitous Systems: Computing, Networking and Services, 2021

Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests.

Yasunori Tateno, Ken Nakata, Akio Oya, Keita Matsuda, Yoshihide Komatsu, Shinichi Osada, Masafumi Hirata, Shigeyuki Ishiyama, Toshiki Yoda, Atsushi Nitta, Tomio Sato

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2008

Low Leakage Current ITO Schottky Electrodes for AlGaN/GaN HEMTs.

Keita Matsuda, Takeshi Kawasaki, Ken Nakata, Takeshi Igarashi, Seiji Yaegassi

IEICE Trans. Electron., 2008