Ken Butler

According to our database, Ken Butler authored at least 3 papers between 2006 and 2022.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2022

Improvements in Automated IC Socket Pin Defect Detection.

Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao

Proceedings of the IEEE International Test Conference, 2022

Zero Trust Approach to IC Manufacturing and Testing.

Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim

Proceedings of the IEEE International Test Conference, 2022

2006

Conference Reports: 2005 International Test Conference.

Ken Butler

IEEE Des. Test Comput., 2006