Kelly A. Ockunzzi

Orcid: 0000-0002-3541-8306

According to our database1, Kelly A. Ockunzzi authored at least 7 papers between 1997 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2016
Practical Application of RAM Sequential Test.
IEEE Des. Test, 2016

Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs.
Proceedings of the 25th IEEE North Atlantic Test Workshop, 2016

2015
Optimizing delay tests at the memory boundary.
Proceedings of the 2015 IEEE International Test Conference, 2015

2001
Breaking Correlation to Improve Testability.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Test Strategies for BIST at the Algorithmic and Register-Transfer Levels.
Proceedings of the 38th Design Automation Conference, 2001

1998
Testability Enhancement for Control-Flow Intensive Behaviors.
J. Electron. Test., 1998

1997
Testability Enhancement for Behavioral Descriptions Containing Conditional Statements.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997


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