Keith A. Jenkins

According to our database, Keith A. Jenkins authored at least 37 papers between 1996 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

Effect of HCI degradation on the variability of MOSFETS.

C. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.

Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Electron mobility in thin In0.53Ga0.47As channel.

Eduard Cartier, Atreya Majumdar, K.-T. Lee, Takashi Ando, Martin M. Frank, John Rozen, Keith A. Jenkins, C. Liang, C.-W. Cheng, John Bruley, M. Hopstaken, Pranita Kerber, J.-B. Yau, X. Sun, Renee T. Mo, Chun-Chen Yeh, Effendi Leobandung, Vijay Narayanan

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016

A statistical critical path monitor in 14nm CMOS.

Bruce M. Fleischer, Christos Vezyrtzis, Karthik Balakrishnan, Keith A. Jenkins

Proceedings of the 34th IEEE International Conference on Computer Design, 2016

2015

A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology.

Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim

IEEE Trans. Very Large Scale Integr. Syst., 2015

The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking.

Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban

IEEE J. Solid State Circuits, 2015

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements.

Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology.

Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Long-term NBTI degradation under real-use conditions in IBM microprocessors.

Pong-Fei Lu, Keith A. Jenkins, Tobias Webel, Oliver Marquardt, Birgit Schubert

Microelectron. Reliab., 2014

5.3 Wide-frequency-range resonant clock with on-the-fly mode changing for the POWER8^TM microprocessor.

Phillip J. Restle, David Shan, David Hogenmiller, Yong Kim, Alan J. Drake, Jason Hibbeler, Thomas J. Bucelot, Gregory S. Still, Keith A. Jenkins, Joshua Friedrich

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2013

On-chip circuit to monitor long-term NBTI and PBTI degradation.

Keith A. Jenkins, Pong-Fei Lu

Microelectron. Reliab., 2013

On-chip circuit for measuring multi-GHz clock signal waveforms.

Keith A. Jenkins, Phillip J. Restle, P. Z. Wang, D. Hogenmiller, David W. Boerstler, Thomas J. Bucelot

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators.

Jente B. Kuang, Keith A. Jenkins, Kevin Stawiasz, Jeremy D. Schaub

Proceedings of the ESSCIRC 2013, 2013

2011

A simple array-based test structure for the AC variability characterization of MOSFETs.

Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

2009

A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry.

Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim

IEEE J. Solid State Circuits, 2009

A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset.

Keith A. Jenkins, Lionel Li

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

Experimental Analysis of Substrate Noise Effect on PLL Performance.

Woogeun Rhee, Keith A. Jenkins, John C. Liobe, Herschel A. Ainspan

IEEE Trans. Circuits Syst. II Express Briefs, 2008

An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process.

Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy

IEEE J. Solid State Circuits, 2008

A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement.

Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim

Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

2007

Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure.

Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks.

Keith A. Jenkins, Kenneth L. Shepard, Zheng Xu

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2005

Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection.

John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang

IBM J. Res. Dev., 2005

On-Chip Spectrum Analyzer for Analog Built-In Self Test.

Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

An on-chip jitter measurement circuit with sub-picosecond resolution.

Keith A. Jenkins, Anup P. Jose, David F. Heidel

Proceedings of the 31st European Solid-State Circuits Conference, 2005

2004

CMOS IC diagnostics using the luminescence of OFF-state leakage currents.

Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Delay chain based programmable jitter generator.

Tian Xia, Peilin Song, Keith A. Jenkins, Jien-Chung Lo

Proceedings of the 9th European Test Symposium, 2004

2003

Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits.

Jean-Olivier Plouchart, Noah Zamdmer, Jonghae Kim, Melanie Sherony, Yue Tan, Asit Ray, Mohamed Talbi, Lawrence F. Wagner, Kun Wu, Naftali E. Lustig, Shreesh Narasimha, Patricia O'Neil, Nghia Phan, Michael Rohn, James Strom, David M. Friend, Stephen V. Kosonocky, Daniel R. Knebel, Suhwan Kim, Keith A. Jenkins, Michel M. Rivier

IBM J. Res. Dev., 2003

2001

A clock distribution network for microprocessors.

Phillip J. Restle, Timothy G. McNamara, David A. Webber, Peter J. Camporese, Kwok F. Eng, Keith A. Jenkins, David H. Allen, Michael J. Rohn, Michael P. Quaranta, David W. Boerstler, Charles J. Alpert, Craig A. Carter, Roger N. Bailey, John G. Petrovick, Byron L. Krauter, Bradley D. McCredie

IEEE J. Solid State Circuits, 2001

2000

Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops.

Keith A. Jenkins, James P. Eckhardt

IEEE Des. Test Comput., 2000

1998

Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor.

Phillip J. Restle, Keith A. Jenkins, Alina Deutsch, Peter W. Cook

IEEE J. Solid State Circuits, 1998

RF circuit design aspects of spiral inductors on silicon.

Joachim N. Burghartz, Daniel C. Edelstein, Mehmet Soyuer, Herschel A. Ainspan, Keith A. Jenkins

IEEE J. Solid State Circuits, 1998

Designing a Testable System on a Chip.

Stephen V. Kosonocky, Arthur A. Bright, Kevin W. Warren, Ruud A. Haring, Steve Klepner, Sameh W. Asaad, S. Basavaiah, Bob Havreluk, David F. Heidel, Michael Immediato, Keith A. Jenkins, Rajiv V. Joshi, Benjamin D. Parker, T. V. Rajeevakumar, Kevin Stawiasz

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

1997

An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator.

Mehmet Soyuer, Joachim N. Burghartz, Herschel A. Ainspan, Keith A. Jenkins, Peter Xiao, Arvin R. Shahani, Margaret S. Dolan, David L. Harame

IEEE J. Solid State Circuits, 1997

Integrated RF components in a SiGe bipolar technology.

Joachim N. Burghartz, Mehmet Soyuer, Keith A. Jenkins, Michael Kies, Margaret Dolan, Kenneth J. Stein, John Malinowski, David L. Harame

IEEE J. Solid State Circuits, 1997

Detecting and Preventing Measurement Errors.

Keith A. Jenkins

IEEE Des. Test Comput., 1997

1996

A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator.

Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Michael D. Hulvey

IEEE J. Solid State Circuits, 1996

A 2.4-GHz silicon bipolar oscillator with integrated resonator.

Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Herschel A. Ainspan, Frank J. Canora, Slaila Ponnapalli, John F. Ewen, William E. Pence

IEEE J. Solid State Circuits, 1996