Kees van Kaam

According to our database, Kees van Kaam authored at least 2 papers between 2001 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2005

Test and debug features of the RTO7 chip.

Kees van Kaam, Bart Vermeulen, Henk Jan Bergveld

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2001

The future of delta I_DDQ testing.

Bram Kruseman, Rudger van Veen, Kees van Kaam

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001