Kedarnath J. Balakrishnan
According to our database1,
Kedarnath J. Balakrishnan
authored at least 21 papers
between 2002 and 2009.
Collaborative distances:
Collaborative distances:
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Bibliography
2009
IEEE Des. Test Comput., 2009
2008
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors.
IEEE Trans. Computers, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007
Test cost reduction for SoC using a combined approach to test data compression and test scheduling.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007
2006
IEEE Trans. Very Large Scale Integr. Syst., 2006
Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
2005
XWRC: externally-loaded weighted random pattern testing for input test data compression.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the 2005 Design, 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
2004
J. Syst. Archit., 2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the 9th European Test Symposium, 2004
Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004
2003
Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003
2002
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002