Kazuhiko Shimakawa

According to our database, Kazuhiko Shimakawa authored at least 6 papers between 2005 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.

Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda

Proceedings of the Symposium on VLSI Circuits, 2015

2014

Highly-reliable TaOx reram technology using automatic forming circuit.

Ken Kawai, Akifumi Kawahara, Ryutaro Yasuhara, Shunsaku Muraoka, Zhiqiang Wei, Ryotaro Azuma, Kouhei Tanabe, Kazuhiko Shimakawa

Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2013

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput.

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

IEEE J. Solid State Circuits, 2013

Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM.

Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Ryutaro Yasuhara, Shunsaku Muraoka, Atsushi Himeno, Naoki Yoshikawa, Hideaki Murase, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012

An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput.

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Kouhei Tanabe, Toshihiro Nakamura, Yoshihiko Sumimoto, Naoki Yamada, Nobuyuki Nakai, Shoji Sakamoto, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Ken-ichi Origasa, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012

2005

A 322 MHz random-cycle embedded DRAM with high-accuracy sensing and tuning.

Masahisa Iida, Naoki Kuroda, Hidefumi Otsuka, Masanobu Hirose, Yuji Yamasaki, Kiyoto Ohta, Kazuhiko Shimakawa, Takashi Nakabayashi, Hiroyuki Yamauchi, Tomohiko Sano, Takayuki Gyohten, Masanao Maruta, Akira Yamazaki, Fukashi Morishita, Katsumi Dosaka, Masahiko Takeuchi, Kazutami Arimoto

IEEE J. Solid State Circuits, 2005