Kaupo Kukli
Orcid: 0000-0002-5821-0364
According to our database1,
Kaupo Kukli
authored at least 4 papers
between 2005 and 2014.
Collaborative distances:
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Bibliography
2014
Single-parameter model for the post-breakdown conduction characteristics of HoTiO<sub>x</sub>-based MIM capacitors.
Microelectron. Reliab., 2014
2007
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition.
Microelectron. Reliab., 2007
Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics.
Microelectron. Reliab., 2007
2005
Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition.
Microelectron. Reliab., 2005