Katsuyuki Sekine
According to our database1,
Katsuyuki Sekine
authored at least 2 papers
between 2010 and 2013.
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Bibliography
2013
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
Microelectron. Reliab., 2013
2010
Proceedings of the 26th IEEE International Conference on Software Maintenance (ICSM 2010), 2010