Katsuyoshi Miura

According to our database, Katsuyoshi Miura authored at least 12 papers between 1997 and 2018.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2018

Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope.

Katsuyoshi Miura, Atsuki Seko, Koji Nakamae

Microelectron. Reliab., 2018

2017

NBTI/PBTI tolerant arbiter PUF circuits.

Koyo Suzuki, Katsuyoshi Miura, Koji Nakamae

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2011

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae

Microelectron. Reliab., 2011

2009

Laser THz emission microscope as a novel tool for LSI failure analysis.

Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa

Microelectron. Reliab., 2009

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.

Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae

IEICE Trans. Electron., 2009

2003

A low energy FIB processing, repair, and test system.

Katsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka

Microelectron. Reliab., 2003

2002

CAD navigation system, for backside waveform probing of CMOS devices.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Microelectron. Reliab., 2002

2001

Development of an EB/FIB Integrated Test System.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Microelectron. Reliab., 2001

1999

Intelligent EB Test System for Automatic VLSI Fault Tracing.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1997

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

J. Electron. Test., 1997

Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.

Katsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, 1997