Karine Mourgues

According to our database, Karine Mourgues authored at least 10 papers between 2004 and 2011.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2011

Characterization and modeling of hot carrier injection in LDMOS for L-band radar application.

Loïc Lachèze, Olivier Latry, Pascal Dherbécourt, Karine Mourgues, V. Purohit, Hichame Maanane, Jean Pierre Sipma, F. Cornu, Philippe Eudeline

Microelectron. Reliab., 2011

2010

A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications.

Olivier Latry, Pascal Dherbécourt, Karine Mourgues, Hichame Maanane, Jean Pierre Sipma, F. Cornu, Philippe Eudeline, Mohamed Masmoudi

Microelectron. Reliab., 2010

2007

Study of hot-carrier effects on power RF LDMOS device reliability.

M. Gares, Mohamed Ali Belaïd, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Philippe Eudeline

Microelectron. Reliab., 2007

Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.

Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon

Microelectron. Reliab., 2007

Reliability study of power RF LDMOS device under thermal stress.

Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, M. Gares, Mohamed Masmoudi, Jérôme Marcon

Microelectron. J., 2007

2006

Study of RF N^- LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF.

Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, K. Ketata, Philippe Eudeline

Microelectron. Reliab., 2006

Hot carrier reliability of RF N- LDMOS for S Band radar application.

M. Gares, Hichame Maanane, Mohamed Masmoudi, Pierre Bertram, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, Philippe Eudeline

Microelectron. Reliab., 2006

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance.

M. Gares, Hichame Maanane, Mohamed Ali Belaïd, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Pierre Bertram, Philippe Eudeline

Proceedings of the Canadian Conference on Electrical and Computer Engineering, 2006

2005

Comparative analysis of accelerated ageing effects on power RF LDMOS reliability.

Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon

Microelectron. Reliab., 2005

2004

Reliability study of Power RF LDMOS for Radar Application.

Hichame Maanane, Pierre Bertram, Jérôme Marcon, Mohamed Masmoudi, Mohamed Ali Belaïd, Karine Mourgues, Philippe Eudeline, K. Ketata

Microelectron. Reliab., 2004