Karine Mourgues

According to our database1, Karine Mourgues authored at least 10 papers between 2004 and 2011.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2011
Characterization and modeling of hot carrier injection in LDMOS for L-band radar application.
Microelectron. Reliab., 2011

2010
A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications.
Microelectron. Reliab., 2010

2007
Study of hot-carrier effects on power RF LDMOS device reliability.
Microelectron. Reliab., 2007

Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.
Microelectron. Reliab., 2007

Reliability study of power RF LDMOS device under thermal stress.
Microelectron. J., 2007

2006
Study of RF N<sup>-</sup> LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF.
Microelectron. Reliab., 2006

Hot carrier reliability of RF N- LDMOS for S Band radar application.
Microelectron. Reliab., 2006

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance.
Proceedings of the Canadian Conference on Electrical and Computer Engineering, 2006

2005
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability.
Microelectron. Reliab., 2005

2004
Reliability study of Power RF LDMOS for Radar Application.
Microelectron. Reliab., 2004


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