Karina Rott

According to our database, Karina Rott authored at least 4 papers between 2012 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Reliability aspects of copper metallization and interconnect technology for power devices.

Frank Hille, Roman Roth, Carsten Schäffer, Holger Schulze, Nicolas Heuck, Daniel Bolowski, Karsten Guth, Alexander Ciliox, Karina Rott, Frank Umbach, Martin Kerber

Microelectron. Reliab., 2016

2014

Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors.

Gunnar Andreas Rott, Karina Rott, Hans Reisinger, Wolfgang Gustin, Tibor Grasser

Microelectron. Reliab., 2014

Characterization and modeling of charge trapping: From single defects to devices.

Tibor Grasser, Gerhard Rzepa, Michael Waltl, Wolfgang Goes, Karina Rott, Gunnar Andreas Rott, Hans Reisinger, Jacopo Franco, Ben Kaczer

Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2012

New insights on the PBTI phenomena in SiON pMOSFETs.

Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser

Microelectron. Reliab., 2012