Karim Inal
Timeline
2015
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Bibliography
2015
Robust design of thermo-mechanical MEMS switch embedded in aluminium BEOL interconnect.
Microelectron. Reliab., 2015
Electromigration-induced failure in operando characterization of 3D interconnects: microstructure influence.
Microelectron. Reliab., 2015
Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices.
Microelectron. Reliab., 2015