Karim Arabi

According to our database, Karim Arabi authored at least 40 papers between 1994 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Exploring the Landscape of Natural Language Processing Research.

Tim Schopf, Karim Arabi, Florian Matthes

Proceedings of the 14th International Conference on Recent Advances in Natural Language Processing, 2023

2021

Edge Computing Trends, Design and Test Challenges - Keynote.

Karim Arabi

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2015

Brain-inspired computing.

Karim Arabi

Proceedings of the 2015 IEEE International Test Conference, 2015

3D VLSI: A Scalable Integration Beyond 2D.

Karim Arabi, Kambiz Samadi, Yang Du

Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29, 2015

2014

Low power design techniques in mobile processes.

Karim Arabi

Proceedings of the International Symposium on Low Power Electronics and Design, 2014

2011

Leakage power profiling and leakage power reduction using DFT hardware.

Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

2010

Guest Editorial.

Karim Arabi

J. Electron. Test., 2010

Power noise and its impact on production test and validation of SoC devices.

Karim Arabi

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Special session 6C: New topic mixed-signal test impact to SoC commercialization.

Karim Arabi

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

2008

Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOS.

Xiongfei Meng, Resve A. Saleh, Karim Arabi

IEEE Trans. Very Large Scale Integr. Syst., 2008

2007

Power Supply Noise in SoCs: Metrics, Management, and Measurement.

Karim Arabi, Resve A. Saleh, Xiongfei Meng

IEEE Des. Test Comput., 2007

A Novel Active Decoupling Capacitor Design in 90nm CMOS.

Xiongfei Meng, Karim Arabi, Resve A. Saleh

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2006

Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology.

Xiongfei Meng, Resve A. Saleh, Karim Arabi

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2004

Mixed RL-Huffman encoding for power reduction and data compression in scan test.

Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

Overview of the IEEE P1500 Standard.

Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Mixed Signal DFT: A Concise Overview.

Bozena Kaminska, Karim Arabi

Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

2002

Multi-GigaHertz Testing Challenges and Solutions.

Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Logic BIST and Scan Test Techniques for Multiple Identical Blocks.

Karim Arabi

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Mixed-Signal BIST: Fact or Fiction.

Karim Arabi

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques.

Mustapha Slamani, Karim Arabi

J. Electron. Test., 2001

1999

Oscillation-test methodology for low-cost testing of active analog filters.

Karim Arabi, Bozena Kaminska

IEEE Trans. Instrum. Meas., 1999

1998

On chip testing data converters using static parameters.

Karim Arabi, Bozena Kaminska, Mohamad Sawan

IEEE Trans. Very Large Scale Integr. Syst., 1998

Design for testability of embedded integrated operational amplifiers.

Karim Arabi, Bozena Kaminska

IEEE J. Solid State Circuits, 1998

Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures.

Karim Arabi, Bozena Kaminska

J. Electron. Test., 1998

Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.

Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation.

Hassan Ihs, Karim Arabi, Bozena Kaminska

Proceedings of the International Conference on Computer Design: VLSI in Computers and Processors, 1998

1997

Testing analog and mixed-signal integrated circuits using oscillation-test method.

Karim Arabi, Bozena Kaminska

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology.

Karim Arabi, Bozena Kaminska

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Analog and Mixed-Signal Benchmark Circuits-First Release.

Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.

Karim Arabi, Bozena Kaminska

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I_DDQ Testing.

Karim Arabi, Bozena Kaminska

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures.

Karim Arabi, Bozena Kaminska

Proceedings of the Proceedings 1997 International Conference on Computer Design: VLSI in Computers & Processors, 1997

Efficient and accurate testing of analog-to-digital converters using oscillation-test method.

Karim Arabi, Bozena Kaminska

Proceedings of the European Design and Test Conference, 1997

1996

BIST for D/A and A/D Converters.

Karim Arabi, Bozena Kaminska, Janusz Rzeszut

IEEE Des. Test Comput., 1996

A new digital test approach for analog-to-digital converter testing.

Mehdi Ehsanian, Bozena Kaminska, Karim Arabi

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Oscillation-test strategy for analog and mixed-signal integrated circuits.

Karim Arabi, Bozena Kaminska

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

A wireless implantable electrical stimulator based on two FPGAs.

Mohamad Sawan, S. Robin, B. Provost, Y. Eid, Karim Arabi

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996

Design for testability of integrated operational amplifiers using oscillation-test strategy.

Karim Arabi, Bozena Kaminska, Stephen K. Sunter

Proceedings of the 1996 International Conference on Computer Design (ICCD '96), 1996

1995

An Offset Compensated CMOS Current-Feedback Operational-Amplifier.

Jieyan Zhu, Mohamad Sawan, Karim Arabi

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995

1994

A new built-in self-test approach for digital-to-analog and analog-to-digital converters.

Karim Arabi, Bozena Kaminska, Janusz Rzeszut

Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994