Karansingh Thakor
According to our database1,
Karansingh Thakor
authored at least 5 papers
between 2021 and 2024.
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Bibliography
2024
A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories.
Proceedings of the IEEE International Memory Workshop, 2024
2022
Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021