Kangkang Guo

According to our database, Kangkang Guo authored at least 9 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

3-D Structure-Oriented Adaptive Gaussian Pyramid for Seismic Multiscale Fracture Detection.

Xin Bo, Xiaohong Chen, Jingye Li, Kangkang Guo, Jiayu Qiao

IEEE Geosci. Remote. Sens. Lett., 2023

2022

Data-Driven Seismic Impedance Inversion Based on Multi-Scale Strategy.

Guang Zhu, Xiaohong Chen, Jingye Li, Kangkang Guo

Remote. Sens., December, 2022

An Investigation on the Influence of Operation Experience on Virtual Hazard Perception Using Wearable Eye Tracking Technology.

Siyu Li, Yongqing Jiang, Chao Sun, Kangkang Guo, Xin Wang

Sensors, 2022

NaGAN: Nadir-like Generative Adversarial Network for Off-Nadir Object Detection of Multi-View Remote Sensing Imagery.

Lei Ni, Chunlei Huo, Xin Zhang, Peng Wang, Luyang Zhang, Kangkang Guo, Zhixin Zhou

Remote. Sens., 2022

Reliability prediction used dynamic Bayesian networks for redundant system with time-lag correlation.

Kaixin Liu, Zhen Zhou, Jia Qi, Yongquan Sun, Kangkang Guo

Qual. Reliab. Eng. Int., 2022

2021

Design of FPGA-Implemented Reed-Solomon Erasure Code (RS-EC) Decoders With Fault Detection and Location on User Memory.

Zhen Gao, Lingling Zhang, Yinghao Cheng, Kangkang Guo, Anees Ullah, Pedro Reviriego

IEEE Trans. Very Large Scale Integr. Syst., 2021

Modeling and Theoretical Analysis of the SERS Enhancement Factor Considering the Electronic Structural Energy.

Xu Yang, Zhen Zhou, Jia Qi, Siqi Zhang, Kangkang Guo, Shou-Bo Zhao

IEEE Access, 2021

2020

Design of SEU-Tolerant Turbo Decoders Implemented on SRAM-FPGAs.

Zhen Gao, Lingling Zhang, Tong Yan, Kangkang Guo, Zhan Xu, Pedro Reviriego

IEEE Trans. Very Large Scale Integr. Syst., 2020

Reliable Classification with Ensemble Convolutional Neural Networks.

Zhen Gao, Han Zhang, Xiaohui Wei, Tong Yan, Kangkang Guo, Wenshuo Li, Yu Wang, Pedro Reviriego

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020