Kan Takeuchi

According to our database, Kan Takeuchi authored at least 16 papers between 2004 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance.

Kan Takeuchi, Masaki Shimada, Shinya Konishi, Daisuke Oshida, Naoya Ota, Takashi Yasumasu, Koji Shibutani, Tomohiro Iwashita, Tetsuya Kokubun, Fumio Tsuchiya

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators.

Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya

IET Circuits Devices Syst., 2018

2017

NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator.

Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2017

2016

FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.

Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya

Proceedings of the ESSCIRC Conference 2016: 42^nd European Solid-State Circuits Conference, 2016

2015

An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology.

Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii

Proceedings of the ESSCIRC Conference 2015, 2015

2014

Assessment of reliability impact on GHz processors with moderate overdrive.

Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

2013

Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise.

Kan Takeuchi, Masaki Shimada, Takao Sato, Yusaku Katsuki, Hiroumi Yoshikawa, Hiroaki Matsushita

IEEE Trans. Very Large Scale Integr. Syst., 2013

2012

28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization.

Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

Non-parametric test of time consistency: Present bias and future bias.

Kan Takeuchi

Games Econ. Behav., 2011

2010

Multi-object auctions with package bidding: An experimental comparison of Vickrey and iBEA.

Yan Chen, Kan Takeuchi

Games Econ. Behav., 2010

2008

Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations.

Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato

IEEE Trans. Very Large Scale Integr. Syst., 2008

Observations of Supply-Voltage-Noise Dispersion in Sub-nsec.

Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato

Proceedings of the 2008 IEEE International Test Conference, 2008

A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process.

Genichi Tanaka, Kan Takeuchi, Minoru Ito, Hiroaki Matsushita

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007

Shake it up baby: scheduling with package auctions.

Kan Takeuchi, John Lin, Yan Chen, Thomas A. Finholt

Proceedings of the Proceedings 8th ACM Conference on Electronic Commerce (EC-2007), 2007

2004

Probabilistic crosstalk delay estimation for ASICs.

Kan Takeuchi, Kazumasa Yanagisawa, Takashi Sato, Kazuko Sakamoto, Saburo Hojo

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

Novel Tactile Sensors Manufactured by Carbon Microcoils.

Xiuqin Chen, Shaoming Yang, M. Hasegawa, Kan Takeuchi, K. Kawabe, Seiji Motojima

Proceedings of the 2004 International Conference on MEMS, 2004