Kalparupa Mukherjee
Orcid: 0000-0003-1387-3321
According to our database1,
Kalparupa Mukherjee
authored at least 5 papers
between 2017 and 2022.
Collaborative distances:
Collaborative distances:
Timeline
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2022
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Bibliography
2022
Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2020
Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices.
Microelectron. Reliab., 2017