K. Y. Ee

According to our database, K. Y. Ee authored at least 2 papers between 2004 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

A study of post-etch wet clean on electrical and reliability performance of Cu/low k interconnections.

C. F. Tsang, C. K. Chang, A. Krishnamoorthy, K. Y. Ee, Y. J. Su, H. Y. Li, W. H. Li, L. Y. Wong

Microelectron. Reliab., 2005

2004

Impact of barrier deposition process on electrical and reliability performance of Cu/CVD low k SiOCH metallization.

C. F. Tsang, C. Y. Li, A. Krishnamoorthy, Y. J. Su, H. Y. Li, L. Y. Wong, W. H. Li, L. J. Tang, K. Y. Ee

Microelectron. J., 2004