K. Tsuda
Orcid: 0000-0002-4840-4851
According to our database1,
K. Tsuda
authored at least 2 papers
between 1995 and 2023.
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Bibliography
2023
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
1995
IEEE J. Solid State Circuits, October, 1995