K. Paul Muller

According to our database, K. Paul Muller authored at least 8 papers between 1999 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

SOI FinFET soft error upset susceptibility and analysis.

Phil Oldiges, Kenneth P. Rodbell, Michael S. Gordon, John G. Massey, Kevin Stawiasz, Conal E. Murray, Henry H. K. Tang, K. Kim, K. Paul Muller

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology.

Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler

Proceedings of the IEEE International Reliability Physics Symposium, 2015

A case study of electromigration reliability: From design point to system operations.

Baozhen Li, K. Paul Muller, James D. Warnock, Leon J. Sigal, Dinesh Badami

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Understanding Soft Error Resiliency of Blue Gene/Q Compute Chip through Hardware Proton Irradiation and Software Fault Injection.

Chen-Yong Cher, Meeta Sharma Gupta, Pradip Bose, K. Paul Muller

Proceedings of the International Conference for High Performance Computing, 2014

Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation.

Chen-Yong Cher, K. Paul Muller, Ruud A. Haring, David L. Satterfield, Thomas E. Musta, Thomas Gooding, Kristan D. Davis, Marc Boris Dombrowa, Gerard V. Kopcsay, Robert M. Senger, Yutaka Sugawara, Krishnan Sugavanam

Proceedings of the 2014 International Test Conference, 2014

Soft Error Resiliency Characterization on IBM BlueGene/Q Processor.

Chen-Yong Cher, K. Paul Muller, Ruud A. Haring, David L. Satterfield, Thomas E. Musta, Thomas Gooding, Kristan D. Davis, Marc Boris Dombrowa, Gerard V. Kopcsay, Robert M. Senger, Yutaka Sugawara, Krishnan Sugavanam

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

2010

POWER7^TM local clocking and clocked storage elements.

James D. Warnock, Leon J. Sigal, Dieter F. Wendel, K. Paul Muller, Joshua Friedrich, Victor V. Zyuban, Ethan H. Cannon, A. J. KleinOsowski

Proceedings of the IEEE International Solid-State Circuits Conference, 2010

1999

Plasma-etching processes for ULSI semiconductor circuits.

Michael Armacost, Peter D. Hoh, Richard Wise, Wendy Yan, Jeffrey J. Brown, John H. Keller, George A. Kaplita, Scott D. Halle, K. Paul Muller, Munir D. Naeem, Senthil Srinivasan, Hung Y. Ng, Martin Gutsche, Alois Gutmann, Bruno Spuler

IBM J. Res. Dev., 1999