K. P. Sou
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2024
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Bibliography
2024
HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application.
Proceedings of the IEEE International Reliability Physics Symposium, 2024