K. Ketata

According to our database1, K. Ketata authored at least 8 papers between 2004 and 2007.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2007
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.
Microelectron. Reliab., 2007

Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses.
Microelectron. Reliab., 2007

Reliability study of power RF LDMOS device under thermal stress.
Microelectron. J., 2007

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET.
Microelectron. J., 2007

2006
Study of RF N<sup>-</sup> LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF.
Microelectron. Reliab., 2006

Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests.
Microelectron. Reliab., 2006

2005
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability.
Microelectron. Reliab., 2005

2004
Reliability study of Power RF LDMOS for Radar Application.
Microelectron. Reliab., 2004


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