K. F. Chuang

According to our database, K. F. Chuang authored at least 1 paper in 2016.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2016

Failure and stress analysis of through-aluminum-nitride-via substrates during thermal reliability tests for high power LED applications.

Ming-Yi Tsai, C. H. Lin, K. F. Chuang, Y. H. Chang, C. T. Wu, S. C. Hu

Microelectron. Reliab., 2016