K. Dhondt

According to our database, K. Dhondt authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2008

MIMC reliability and electrical behavior defined by a physical layer property of the dielectric.

Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, Alexandru Vlad, Jean-Pierre Raskin

Microelectron. Reliab., 2008