Jyotika Athavale
Orcid: 0000-0001-6427-2687
According to our database1,
Jyotika Athavale
authored at least 12 papers
between 2019 and 2024.
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Bibliography
2024
Innovation Practices Track: Advances on Silicon Lifecycle Reliability, Safety and Security.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024
2023
Computer, February, 2023
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs.
Proceedings of the IEEE European Test Symposium, 2023
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
2022
On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model.
Computer, 2022
Proceedings of the IEEE European Test Symposium, 2022
2021
2020
Trends and Functional Safety Certification Strategies for Advanced Railway Automation Systems.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, 2020
2019
Flight Safety Certification Implications for Complex Multi-Core Processor Based Avionics Systems.
Proceedings of the IEEE International Reliability Physics Symposium, 2019