Jwu E. Chen
According to our database1,
Jwu E. Chen
authored at least 53 papers
between 1991 and 2023.
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Bibliography
2023
Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method.
J. Circuits Syst. Comput., August, 2023
IEEE Des. Test, June, 2023
J. Electron. Test., April, 2023
2022
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect.
Sensors, 2022
2021
Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling.
Proceedings of the IEEE International Test Conference, 2021
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering.
Proceedings of the 26th IEEE European Test Symposium, 2021
2020
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing.
Proceedings of the IEEE International Test Conference in Asia, 2020
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
2019
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements.
J. Electron. Test., 2019
2009
IEEE Trans. Very Large Scale Integr. Syst., 2009
2007
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection.
J. Electron. Test., 2007
2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs.
Proceedings of the 2006 IEEE International Test Conference, 2006
2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005
2004
A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004
A New BIST Scheme Based on a Summing-into-Timing-Signal Principle with Self Calibration for the DAC.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004
2003
Structure-Based Specification-Constrained Test Frequency Generation for Linear Analog Circuits.
J. Inf. Sci. Eng., 2003
2002
J. Electron. Test., 2002
An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits.
Proceedings of the 2002 Design, 2002
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002
2001
Guardband Determination for the Detection of Off-State and Junction Leakages in DRAM Testing.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001
2000
J. Inf. Sci. Eng., 2000
J. Electron. Test., 2000
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000
1999
J. Inf. Sci. Eng., 1999
Proceedings of the 4th European Test Workshop, 1999
1998
Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation.
Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
1997
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997
1996
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996
1995
Proceedings of the 25th IEEE International Symposium on Multiple-Valued Logic, 1995
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995
1994
Proceedings of the 24th IEEE International Symposium on Multiple-Valued Logic, 1994
Proceedings of the 24th IEEE International Symposium on Multiple-Valued Logic, 1994
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994
1992
Proceedings of the 22nd IEEE International Symposium on Multiple-Valued Logic, 1992
1991
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991
J. Electron. Test., 1991