Justyna Zawada
Orcid: 0000-0002-1881-8164
According to our database1,
Justyna Zawada
authored at least 14 papers
between 2014 and 2022.
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Bibliography
2022
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
2020
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the IEEE International Test Conference, 2020
2019
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019
2018
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
Proceedings of the IEEE International Test Conference, 2018
2017
Proceedings of the IEEE International Test Conference, 2017
2016
Proceedings of the 2016 IEEE International Test Conference, 2016
Proceedings of the 25th IEEE Asian Test Symposium, 2016
2015
Proceedings of the 2015 IEEE International Test Conference, 2015
Proceedings of the 52nd Annual Design Automation Conference, 2015
2014
Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014