Jushan Xie

According to our database, Jushan Xie authored at least 2 papers between 2017 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Recent Updates to Transistor Level Reliability Analysis.

Art Schaldenbrand, Jushan Xie, Hany Elhak

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017

Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator.

Shaofeng Guo, Runsheng Wang, Zhuoqing Yu, Peng Hao, Pengpeng Ren, Yangyuan Wang, Siyu Liao, Chunyi Huang, Tianlei Guo, Alvin Chen, Jushan Xie, Ru Huang

Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017