Jurriaan Schmitz

According to our database, Jurriaan Schmitz authored at least 12 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Characterisation of Photodiodes in 22 nm FDSOI at 850 nm.

Jelle H. T. Bakker, Mark S. Oude Alink, Jurriaan Schmitz, Bram Nauta

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2020

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices.

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Towards understanding recovery of hot-carrier induced degradation.

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz

Microelectron. Reliab., 2018

2017

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz

Microelectron. Reliab., 2017

2014

Silicon LEDs in FinFET technology.

Giulia Piccolo, Piet I. Kuindersma, Lars-Åke Ragnarsson, Raymond J. E. Hueting, Nadine Collaert, Jurriaan Schmitz

Proceedings of the 44th European Solid State Device Research Conference, 2014

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis.

Alessandro Ferrara, Peter G. Steeneken, Boni K. Boksteen, Anco Heringa, Andries J. Scholten, Jurriaan Schmitz, Raymond J. E. Hueting

Proceedings of the 44th European Solid State Device Research Conference, 2014

2013

Role of junction depth in light emission from silicon p-i-n leds.

Giulia Piccolo, Amir Sammak, Raymond J. E. Hueting, Jurriaan Schmitz, Lis K. Nanver

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Micro- and nano-link ultra-low power heaters for sensors.

Alfons W. Groenland, Elizaveta Vereshchagina, Alexey Y. Kovalgin, Rob A. M. Wolters, J. G. E. Gardeniers, Jurriaan Schmitz

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2008

RF CMOS reliability simulations.

Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz

Microelectron. Reliab., 2008

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip.

Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz

Microelectron. Reliab., 2008

2007

Low-frequency noise in hot-carrier degraded nMOSFETs.

Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz

Microelectron. Reliab., 2007

2006

Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs.

Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz

Microelectron. Reliab., 2006