Junru Qu
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2024