Junkang Li
Orcid: 0009-0000-6015-0084
According to our database1,
Junkang Li
authored at least 15 papers
between 2017 and 2025.
Collaborative distances:
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Bibliography
2025
J. Artif. Intell. Res., 2025
2024
Proceedings of the Thirty-Third International Joint Conference on Artificial Intelligence, 2024
Proceedings of the Thirty-Eighth AAAI Conference on Artificial Intelligence, 2024
2023
DHHFL-MABAC approach based on distance measure and comprehensive weight for sewage treatment company selection.
Soft Comput., December, 2023
Games with incomplete information: complexity, algorithmics, reasoning. (Jeux à infοrmatiοn incοmplète: cοmplexité, algοrithmique, raisοnnement).
PhD thesis, 2023
Electrical Properties of Each Channels in Vertical Stacked Gate-All-Around Nanosheet s-Si pMOSFETs.
Proceedings of the International Conference on IC Design and Technology, 2023
Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise.
Proceedings of the International Conference on IC Design and Technology, 2023
2022
A TM-Based Adaptive Learning Data-Model for Trajectory Tracking and Real-Time Control of a Class of Nonlinear Systems.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022
Determination of Domain Wall Velocity and Nucleation Time by Switching Dynamics Studies of Ferroelectric Hafnium Zirconium Oxide.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Proceedings of the Thirty-First International Joint Conference on Artificial Intelligence, 2022
2020
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the 2018 International Conference on IC Design & Technology, 2018
2017
NiGe metal source/drain Ge pMOSFETs for future high performance VLSI circuits applications.
Proceedings of the 12th IEEE International Conference on ASIC, 2017