Jung-Uk An

According to our database, Jung-Uk An authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

The self-formatting barrier characteristics of Cu-Mg/SiO₂ and Cu-Ru/SiO₂ films for Cu interconnects.

Seol-Min Yi, Kwang-Ho Jang, Jung-Uk An, Sang-Soo Hwang, Young-Chang Joo

Microelectron. Reliab., 2008