Jung-Suk Goo

According to our database, Jung-Suk Goo authored at least 5 papers between 2002 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection.

Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2012

Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables.

Bo Yu, Xin Li, James Yonemura, Zhiyuan Wu, Jung-Suk Goo, Ciby Thuruthiyil, Ali Icel

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2008

Compact modeling and simulation of PD-SOI MOSFETs: Current status and challenges.

Jung-Suk Goo, Richard Q. Williams, Glenn O. Workman, Qiang Chen, Sungjae Lee, Edward J. Nowak

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007

Impact of stress on various circuit characteristics in 65nm PDSOI technology.

Sushant Suryagandh, Mayank Gupta, Zhiyuan Wu, Srinath Krishnan, Mario Pelella, Jung-Suk Goo, Ciby Thuruthiyil, Judy X. An, Brian Q. Chen, Niraj Subba, Luis Zamudio, James Yonemura, Ali B. Icel

Proceedings of the 33rd European Solid-State Circuits Conference, 2007

2002

A noise optimization technique for integrated low-noise amplifiers.

Jung-Suk Goo, Hee-Tae Ahn, Donald J. Ladwig, Zhiping Yu, Thomas H. Lee, Robert W. Dutton

IEEE J. Solid State Circuits, 2002