Jung-Eun Seok

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Bibliography

2019
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Effect of DC/AC stress on the reliability of cell capacitor in DRAM.
Microelectron. Reliab., 2018

Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM.
Microelectron. Reliab., 2018

2008
Optimization of gate poly TAB size and reliability on short channel pMOSFET.
Microelectron. Reliab., 2008


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