Junchao Chen
Orcid: 0000-0002-4413-0937Affiliations:
- Leibniz-Institut für innovative Mikroelektronik, Frankfurt Oder, Germany
According to our database1,
Junchao Chen
authored at least 28 papers
between 2019 and 2024.
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Bibliography
2024
Design and analysis of an adaptive radiation resilient RRAM subsystem for processing systems in satellites.
Des. Autom. Embed. Syst., June, 2024
Machine Learning Methodologies to Predict the Results of Simulation-Based Fault Injection.
IEEE Trans. Circuits Syst. I Regul. Pap., May, 2024
Toward Critical Flip-Flop Identification for Soft-Error Tolerance With Graph Neural Networks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2024
FPGA Implementation of a Fault-Tolerant Fused and Branched CNN Accelerator With Reconfigurable Capabilities.
IEEE Access, 2024
Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024
Silicon Lifecycle Management Based on On-Chip Cross-Layer Sensing and Analytics for Space Applications.
Proceedings of the 25th IEEE Latin American Test Symposium, 2024
Space Radiation Flux Driven Fault Injection for Evaluating Dynamic Mitigation Strategies.
Proceedings of the 25th IEEE Latin American Test Symposium, 2024
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024
Towards SEU Fault Propagation Prediction with Spatio-Temporal Graph Convolutional Networks.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
2023
A self-adaptive resilient method for implementing and managing the high-reliability processing system (Eine selbstadaptive belastbare Methode zum Implementieren und Verwalten von hochzuverlässigen Verarbeitungssysteme)
PhD thesis, 2023
Proceedings of the IEEE Nordic Circuits and Systems Conference, 2023
Proceedings of the IEEE European Test Symposium, 2023
Proceedings of the 26th Euromicro Conference on Digital System Design, 2023
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023
2022
A design concept for radiation hardened RADFET readout system for space applications.
Microprocess. Microsystems, April, 2022
Solar Particle Event and Single Event Upset Prediction from SRAM-Based Monitor and Supervised Machine Learning.
IEEE Trans. Emerg. Top. Comput., 2022
A Methodology for Identifying Critical Sequential Circuits with Graph Convolutional Networks.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022
2021
CoRR, 2021
Proceedings of the IEEE Nordic Circuits and Systems Conference, NorCAS 2021, Oslo, 2021
Classification of Space Particle Events using Supervised Machine Learning Algorithms.
Proceedings of the 8th IEEE International Conference on Data Science and Advanced Analytics, 2021
A Tunable Single Event Transient Filter Based on Digitally Controlled Capacitive Delay Cells.
Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021
2020
Microelectron. J., 2020
Proceedings of the IEEE East-West Design & Test Symposium, 2020
Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020
Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020
2019
Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019
Proceedings of the 22nd Euromicro Conference on Digital System Design, 2019