Jun Zhou

According to our database, Jun Zhou authored at least 7 papers between 2019 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications.

Aibin Yan, Zhihui He, Jun Zhou, Jie Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard

Microelectron. J., 2021

2020

Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets.

Aibin Yan, Yan Chen, Yuanjie Hu, Jun Zhou, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen

IEEE Trans. Circuits Syst., 2020

Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors.

Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen

Proceedings of the IEEE International Test Conference in Asia, 2020

A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.

Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets.

Aibin Yan, Jun Zhou, Yuanjie Hu, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen

IEEE Access, 2019

Design of a Novel Self-Recoverable SRAM Cell Protected Against Soft Errors.

Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Zhen Wu, Tianming Ni

Proceedings of the 6th International Conference on Dependable Systems and Their Applications, 2019

Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications.

Aibin Yan, Zhen Wu, Jun Zhou, Yuanjie Hu, Yan Chen, Zuobin Ying, Xiaoqing Wen, Patrick Girard

Proceedings of the 28th IEEE Asian Test Symposium, 2019