Jun Yeong Lim

According to our database, Jun Yeong Lim authored at least 3 papers between 2013 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics.

Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun

Microelectron. Reliab., 2015

Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices.

Jun Yeong Lim, Ilgu Yun

Microelectron. Reliab., 2015

2013

Methodology for improvement of data retention in floating gate flash memory using leakage current estimation.

Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun

Microelectron. Reliab., 2013