Julien Vast

According to our database, Julien Vast authored at least 1 paper in 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Back-end soft and hard defect monitoring using a single test chip.

Fabrice Rigaud, Jean-Michel Portal, Hassen Aziza, Didier Née, Julien Vast, Fabrice Argoud, Bertrand Borot

Microelectron. Reliab., 2011