Julien Goxe

Affiliations:

Freescale Semiconducteurs France, Toulouse, France

According to our database¹, Julien Goxe authored at least 4 papers between 2013 and 2015.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of five.

Timeline

Legend:

Book

In proceedings

Article

PhD thesis

Dataset

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Bibliography

2015

Latent gate oxide defects case studies.

[BibT_eX]

[DOI]

Julien Goxe

C. Abouda

Béatrice Vanhuffel

Microelectron. Reliab., 2015

Failure analysis on recovering low resistive via in mixed-mode device.

[BibT_eX]

[DOI]

M. Castignolles

Julien Goxe

R. Martin

Microelectron. Reliab., 2015

2013

Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion.

[BibT_eX]

[DOI]

Yann Weber

Julien Goxe

M. Castignolles

Microelectron. Reliab., 2013

Benefits of field failure distribution modeling to the failure analysis.

[BibT_eX]

[DOI]

Corinne Bergès

Julien Goxe

Microelectron. Reliab., 2013

Julien Goxe

Timeline

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On csauthors.net:

Bibliography

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