Juhong Zhu

According to our database, Juhong Zhu authored at least 5 papers between 2001 and 2003.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2003

Transition Test Generation using Replicate-and-Reduce Transform for Scan-based Designs.

Magdy S. Abadir, Juhong Zhu

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Automated Test Model Generation from Switch Level Custom Circuits.

Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

An automated method for test model generation from switch level circuits.

Tim McDougall, Atanas N. Parashkevov, Simon Jolly, Juhong Zhu, Jing Zeng, Carol Pyron, Magdy S. Abadir

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002

On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults.

Li-C. Wang, Magdy S. Abadir, Juhong Zhu

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor.

Magdy S. Abadir, Juhong Zhu, Li-C. Wang

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001